Title :
Reach-Through Avalanche Photodiodes in Soft X-ray Detection
Author :
Gouvea, A.L. ; Antognini, Aldo ; Kottmann, Franz ; Pohl, Randolf ; Fernandes, L.M.P.
Author_Institution :
Instrum. Center, Univ. of Coimbra, Coimbra, Portugal
Abstract :
Reach-through avalanche photodiodes (RT-APDs) from Hamamatsu Photonics, with different active areas, 5 × 5 and 3 × 3 mm2, were investigated to evaluate their suitability for the muonic helium Lamb shift experiment. The gain has been determined as a function of voltage and temperature for both prototypes. As expected, it increases with increasing bias voltage and with decreasing temperature. The gain variation with temperature is smaller than per -2% °C even for higher bias voltages applied to the RT-APD. The non-linearity between gain obtained for X-rays and visible light pulses has been investigated for different temperatures. The non-linearity was found to increase with decreasing temperature. For example at 350 V, it is as high as 25% at -20 °C and about 10% at 20 °C. The RT-APDs performance for the detection of 8 keV X-rays has been investigated. The best energy resolution was achieved for the larger prototype for a temperature of 0 °C. The minimum energy resolution values, between 9.2 and 9.9%, were obtained for gains between 55 and 80. The minimum detectable energy observed is about 0.2 keV for the higher gain region, for both RT-APDs, investigated, with no significant improvement at lower temperatures.
Keywords :
Lamb shift; X-ray detection; avalanche photodiodes; helium; photodetectors; Hamamatsu photonics; RT-APD; bias voltage; electron volt energy 0.2 keV; electron volt energy 8 keV; gain variation; muonic helium Lamb shift experiment; reach through avalanche photodiode; soft X-ray detection; Avalanche photodiodes; Detectors; Energy resolution; Photonics; Prototypes; Temperature measurement; X-ray detection; Energy resolution; gain non-linearity; minimum detectable energy; reach-through avalanche photodiodes (RT-APDs); soft X-ray detection;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2014.2331461