Title :
Triroc: A Multi-Channel SiPM Read-Out ASIC for PET/PET-ToF Application
Author :
Ahmad, Salleh ; Fleury, Julien ; de la Taille, Christophe ; Seguin-Moreau, Nathalie ; Dulucq, Frederic ; Martin-Chassard, Gisele ; Callier, Stephane ; Thienpont, Damien ; Raux, Ludovic
Author_Institution :
Weeroc SAS, Orsay, France
Abstract :
Triroc is the latest addition to SiPM readout ASICs family developed at Weeroc, a start-up company from the Omega microelectronics group of IN2P3/CNRS. This chip is developed under the framework TRIMAGE European project which is aimed for building a cost effective tri-modal PET/MR/EEG brain scan. To ensure the flexibility and compatibility with any SiPM in the market, the ASIC is designed to be capable of accepting negative and positive polarity input signals. This 64-channel ASIC, is suitable for SiPM readout which requires high accuracy timing and charge measurements. Targeted applications would be PET prototyping with time-of-flight capability. Main features of Triroc includes high dynamic range ADC up to 2500 photoelectrons and TDC fine time binning of 40 ps. Triroc requires very minimal external components which means it is a good contender for compact multichannel PET prototyping. Triroc is designed by using AMS 0.35 μm SiGe technology and it was submitted in March 2014. The detail design of this chip will be presented.
Keywords :
application specific integrated circuits; nuclear electronics; photomultipliers; positron emission tomography; readout electronics; AMS SiGe technology; IN2P3/CNRS; Omega microelectronics group; PET application; PET-ToF application; TDC fine time binning; TRIMAGE European project; Triroc; Weeroc; chip design; compact multichannel PET prototyping; multichannel SiPM read-out ASIC; negative polarity input signals; photoelectrons; positive polarity input signals; time-of-flight capability; tri-modal PET/MR/EEG brain scan; Application specific integrated circuits; Charge measurement; Detectors; Europe; Linearity; Positron emission tomography; Timing; BiCMOS integrated circuits; mixed analog digital integrated circuits; photodetectors; positron emission tomography;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2015.2397973