DocumentCode
111176
Title
Robust Hybrid Memristor-CMOS Memory: Modeling and Design
Author
Mohammad, Baker ; Homouz, Dirar ; Elgabra, H.
Author_Institution
Khalifa Univ., Abu Dhabi, United Arab Emirates
Volume
21
Issue
11
fYear
2013
fDate
Nov. 2013
Firstpage
2069
Lastpage
2079
Abstract
In this paper, we explore various aspects of memristor modeling and use them to propose improved access operations and design of a memristor-based memory. We study the current mathematical and SPICE modeling of memristors and compare them with known device specifications. Based on this survey of existing models, we adopt an improved mathematical model of the memristor that captures the well-established features of memristive devices. This modeling is used to analyze the time and voltage characteristics of stable read and write operations. The tradeoffs between the various design parameters such as voltage, frequency, noise margin, and area are also analyzed. Based on the device modeling, we propose a hybrid CMOS-memristor memory cell and architecture that addresses the limitations of memristor such as state drift, cell-cell interference, and refresh requirements. Memristor is used as a state element, and CMOS-based transistors are used to isolate, control, decode, and inter operate the logic. We verify our design using SPICE simulation using a 28-nm model for CMOS and a modified memristor model.
Keywords
CMOS memory circuits; SPICE; adjacent channel interference; circuit simulation; memory architecture; memristors; semiconductor device models; CMOS-based transistors; SPICE modeling; SPICE simulation; access operations; cell-cell interference; device modeling; device specifications; hybrid CMOS-memristor memory cell; mathematical model; memory architecture; memristive devices; memristor modeling; memristor-based memory; read and write operations; refresh requirements; robust hybrid memristor-CMOS memory; state drift; time characteristic; voltage characteristic; Equations; Mathematical model; Memristors; Resistance; Semiconductor device modeling; Semiconductor process modeling; Switches; Emerging technology; low power; memristor; nonvolatile memory; semiconductor memory;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2012.2227519
Filename
6400279
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