DocumentCode :
1111918
Title :
Even Smaller and Faster Devices at 41st IEDM
Volume :
11
Issue :
6
fYear :
1995
Firstpage :
17
Keywords :
Electron devices; Electronic equipment testing; Integrated circuit interconnections; Nonvolatile memory; Optical fiber testing; Optical fibers; Paper technology; Poles and towers; Probes; Solid state circuit design;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.1995.476611
Filename :
476611
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1111918
