DocumentCode
1111918
Title
Even Smaller and Faster Devices at 41st IEDM
Volume
11
Issue
6
fYear
1995
Firstpage
17
Keywords
Electron devices; Electronic equipment testing; Integrated circuit interconnections; Nonvolatile memory; Optical fiber testing; Optical fibers; Paper technology; Poles and towers; Probes; Solid state circuit design;
fLanguage
English
Journal_Title
Circuits and Devices Magazine, IEEE
Publisher
ieee
ISSN
8755-3996
Type
jour
DOI
10.1109/MCD.1995.476611
Filename
476611
Link To Document