DocumentCode
1112116
Title
Easily Testable Iterative Systems
Author
Friedman, Arthur D.
Author_Institution
Department of Electrical Engineering and Computer Science, University of Southern California
Issue
12
fYear
1973
Firstpage
1061
Lastpage
1064
Abstract
It has been shown that the number of tests required to detect all faults in a one-dimensional unilateral combinational iterative array consisting of p cells will, in general, be proportional to p. In this paper we consider properties of such systems that enable them to be tested with a fixed constant number of tests independent of p, the number of cells in the system. Such systems are referred to as C-testable. Necessary and sufficient conditions on the basic cell state table are derived for an iterative system to be C-testable. It is shown that an arbitrary N-state cell table can be augmented by the addition of, at most, one row and less than [log2 N]2 columns (for N ≥ 2) so as to be C-testable.
Keywords
Fault detection, iterative systems.; Fault detection; Helium; Logic arrays; Sufficient conditions; System testing; Fault detection, iterative systems.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1973.223651
Filename
1672244
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