DocumentCode
1112339
Title
Influence of guiding testability measure on number of backtracks of ATPG program
Author
Chiorboli, G. ; Ferrari, A.
Author_Institution
Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
Volume
136
Issue
4
fYear
1989
fDate
7/1/1989 12:00:00 AM
Firstpage
316
Lastpage
320
Abstract
A major problem, in accelerating an algorithm for test generation, is how to reduce the number of backtracks. The paper considers different measures of controllability and observability, and compares the number of backtracks obtained on large combinational circuits. The paper proposes a new controllability measure which is, on average, more efficient than the others.
Keywords
automatic testing; combinatorial circuits; controllability; logic testing; observability; ATPG program; automatic test pattern generation; combinational circuits; controllability; number of backtracks; observability; testability measure guiding;
fLanguage
English
Journal_Title
Computers and Digital Techniques, IEE Proceedings E
Publisher
iet
ISSN
0143-7062
Type
jour
Filename
29516
Link To Document