Title :
Influence of guiding testability measure on number of backtracks of ATPG program
Author :
Chiorboli, G. ; Ferrari, A.
Author_Institution :
Dipartimento di Elettronica, Inf. e Sistemistica, Bologna Univ., Italy
fDate :
7/1/1989 12:00:00 AM
Abstract :
A major problem, in accelerating an algorithm for test generation, is how to reduce the number of backtracks. The paper considers different measures of controllability and observability, and compares the number of backtracks obtained on large combinational circuits. The paper proposes a new controllability measure which is, on average, more efficient than the others.
Keywords :
automatic testing; combinatorial circuits; controllability; logic testing; observability; ATPG program; automatic test pattern generation; combinational circuits; controllability; number of backtracks; observability; testability measure guiding;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E
