DocumentCode :
1112401
Title :
SOI TFT´s with directly contacted ITO
Author :
Mimura, Akio ; Oohayashi, Masayuki ; Ohue, Michio ; Ohwada, Jun´Ichi ; Hosokawa, Yoshikazu
Author_Institution :
Hitachi Ltd., Hitachi, Ibaraki, Japan
Volume :
7
Issue :
2
fYear :
1986
fDate :
2/1/1986 12:00:00 AM
Firstpage :
134
Lastpage :
136
Abstract :
N-channel Al-gate thin-film transistors (TFT´s) were fabricated on a silicon on insulator (SOI). Indium tin oxide (ITO) was deposited directly on the n+ silicon layer of the TFT. The contact resistance between the ITO and the n+ silicon layer increases with thermal annealing. The low temperature (200°C) lift-off method of ITO is applied to achieve high-quality TFT´s for active matrices in liquid crystal displays (LCD´s).
Keywords :
Annealing; Contact resistance; Driver circuits; Fabrication; Indium tin oxide; Liquid crystal displays; Resists; Silicon on insulator technology; Sputtering; Thin film transistors;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26319
Filename :
1486142
Link To Document :
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