DocumentCode
1112475
Title
Pseudomorphic bipolar quantum resonant-tunneling transistor
Author
Seabaugh, Alan C. ; Frensley, William R. ; Randall, John N. ; Reed, Mark A. ; Farrington, Dewey L. ; Matyi, Richard J.
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
Volume
36
Issue
10
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
2328
Lastpage
2334
Abstract
A bipolar tunneling transistor in which ohmic contact is made to the strained p+ InGaAs quantum well of a double-barrier resonant-tunneling structure is discussed. The heterojunction transistor consists of an n-GaAs emitter and collector, undoped AlGaAs tunnel barriers, and a pseudomorphic p+ InGaAs quantum-well base. By making ohmic contact to the p-type quantum well, the hole density in the quantum-well base is used to modulate the base potential relative to the emitter and collector terminals. With control of the quantum-well potential, the tunneling current can be modulated by application of a base-to-emitter potential. The authors detail the physical and electrical characteristics of the device. It is found that the base-emitter voltages required to bias the transistor into resonance are well predicted by a self-consistent calculation of the electrostatic potential
Keywords
III-V semiconductors; aluminium compounds; carrier density; electric potential; gallium arsenide; heterojunction bipolar transistors; hot electron transistors; indium compounds; AlGaAs tunnel barriers; InGaAs quantum well; InGaAs-AlGaAs-GaAs; base potential; base-emitter voltages; base-to-emitter potential; bipolar tunneling transistor; double-barrier resonant-tunneling structure; electrical characteristics; heterojunction transistor; hole density; ohmic contact; quantum-well potential; self-consistent calculation; tunneling current; Electric variables; Electrostatics; Heterojunctions; Indium gallium arsenide; Ohmic contacts; Quantum well devices; Quantum wells; Resonance; Resonant tunneling devices; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.40918
Filename
40918
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