• DocumentCode
    1112475
  • Title

    Pseudomorphic bipolar quantum resonant-tunneling transistor

  • Author

    Seabaugh, Alan C. ; Frensley, William R. ; Randall, John N. ; Reed, Mark A. ; Farrington, Dewey L. ; Matyi, Richard J.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    36
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    2328
  • Lastpage
    2334
  • Abstract
    A bipolar tunneling transistor in which ohmic contact is made to the strained p+ InGaAs quantum well of a double-barrier resonant-tunneling structure is discussed. The heterojunction transistor consists of an n-GaAs emitter and collector, undoped AlGaAs tunnel barriers, and a pseudomorphic p+ InGaAs quantum-well base. By making ohmic contact to the p-type quantum well, the hole density in the quantum-well base is used to modulate the base potential relative to the emitter and collector terminals. With control of the quantum-well potential, the tunneling current can be modulated by application of a base-to-emitter potential. The authors detail the physical and electrical characteristics of the device. It is found that the base-emitter voltages required to bias the transistor into resonance are well predicted by a self-consistent calculation of the electrostatic potential
  • Keywords
    III-V semiconductors; aluminium compounds; carrier density; electric potential; gallium arsenide; heterojunction bipolar transistors; hot electron transistors; indium compounds; AlGaAs tunnel barriers; InGaAs quantum well; InGaAs-AlGaAs-GaAs; base potential; base-emitter voltages; base-to-emitter potential; bipolar tunneling transistor; double-barrier resonant-tunneling structure; electrical characteristics; heterojunction transistor; hole density; ohmic contact; quantum-well potential; self-consistent calculation; tunneling current; Electric variables; Electrostatics; Heterojunctions; Indium gallium arsenide; Ohmic contacts; Quantum well devices; Quantum wells; Resonance; Resonant tunneling devices; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.40918
  • Filename
    40918