Title :
Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results
Author :
Du, Min-Wen ; Weiss, C.Dennis
Author_Institution :
College of Engineering, National Chiao Tung University
fDate :
3/1/1973 12:00:00 AM
Abstract :
A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.
Keywords :
Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.; Circuit faults; Circuit testing; Combinational circuits; Computer networks; Computer science; Electrical fault detection; Fault detection; Fault trees; Intelligent networks; Logic; Combinational logic networks, computational experiments, fault detection, fault tree, function verification, multiple faults.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1973.223700
