DocumentCode :
1112638
Title :
Beyond-punchthrough current in GaAs MESFET´s
Author :
Smith, Thane
Author_Institution :
COSMAT Laboratories, Clarksburg, MD
Volume :
7
Issue :
3
fYear :
1986
fDate :
3/1/1986 12:00:00 AM
Firstpage :
188
Lastpage :
189
Abstract :
In a recent letter published in this journal, Patrick et al. reported on a maximum drain voltage for pinchoff Which varied exponentially with gate length in very short-gate GaAs MESFET´s. The I-V characteristics given showed that this variation is associated with beyond-punchthrough drain current. Current flowing across a depleted region is an instance of the triode mode of FET operation described by other researchers in 1966. Triode-mode theory can help in the understanding of the behavior of GaAs MESFET´s near pinchoff, including the devices of Patrick et al.
Keywords :
Avalanche breakdown; Breakdown voltage; Diodes; Electric breakdown; Electrons; FETs; Gallium arsenide; MESFETs; Potential energy; Tunneling;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1986.26339
Filename :
1486162
Link To Document :
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