• DocumentCode
    1112638
  • Title

    Beyond-punchthrough current in GaAs MESFET´s

  • Author

    Smith, Thane

  • Author_Institution
    COSMAT Laboratories, Clarksburg, MD
  • Volume
    7
  • Issue
    3
  • fYear
    1986
  • fDate
    3/1/1986 12:00:00 AM
  • Firstpage
    188
  • Lastpage
    189
  • Abstract
    In a recent letter published in this journal, Patrick et al. reported on a maximum drain voltage for pinchoff Which varied exponentially with gate length in very short-gate GaAs MESFET´s. The I-V characteristics given showed that this variation is associated with beyond-punchthrough drain current. Current flowing across a depleted region is an instance of the triode mode of FET operation described by other researchers in 1966. Triode-mode theory can help in the understanding of the behavior of GaAs MESFET´s near pinchoff, including the devices of Patrick et al.
  • Keywords
    Avalanche breakdown; Breakdown voltage; Diodes; Electric breakdown; Electrons; FETs; Gallium arsenide; MESFETs; Potential energy; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26339
  • Filename
    1486162