Title :
Beyond-punchthrough current in GaAs MESFET´s
Author_Institution :
COSMAT Laboratories, Clarksburg, MD
fDate :
3/1/1986 12:00:00 AM
Abstract :
In a recent letter published in this journal, Patrick et al. reported on a maximum drain voltage for pinchoff Which varied exponentially with gate length in very short-gate GaAs MESFET´s. The I-V characteristics given showed that this variation is associated with beyond-punchthrough drain current. Current flowing across a depleted region is an instance of the triode mode of FET operation described by other researchers in 1966. Triode-mode theory can help in the understanding of the behavior of GaAs MESFET´s near pinchoff, including the devices of Patrick et al.
Keywords :
Avalanche breakdown; Breakdown voltage; Diodes; Electric breakdown; Electrons; FETs; Gallium arsenide; MESFETs; Potential energy; Tunneling;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1986.26339