Title :
Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration
Author :
Williams, Dylan F. ; Clement, Tracy S. ; Remley, Kate A. ; Hale, Paul D. ; Verbeyst, Frans
Author_Institution :
Nat. Inst. of Standards & Technol., Boulder
Abstract :
We use traceable swept-sine and electrooptic-sampling-system-based sampling-oscilloscope calibrations to measure the systematic error of the nose-to-nose calibration, and compare the results to simulations. Our results show that the errors in the nose-to-nose calibration are small at low frequencies, but significant at high frequencies.
Keywords :
calibration; electro-optical devices; measurement errors; oscilloscopes; electrooptic-sampling-system; impedance mismatch; mismatch correction; nose-to-nose sampling-oscilloscope calibration; swept-sine calibration; Calibration; Capacitors; Circuits; Convolution; Fourier transforms; Oscilloscopes; Pulse generation; Pulse measurements; Pulse shaping methods; Sampling methods; Calibration; electrooptic sampling; impedance mismatch; mismatch correction; nose-to-nose calibration; sampling oscilloscope; swept-sine calibration;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2007.904333
