DocumentCode
1112815
Title
Table of contents
Volume
56
Issue
3
fYear
2007
Lastpage
365
Abstract
The following topics are dealt with: integrated circuit reliability; digital nanometer circuits; software reliability; and fault trees.
Keywords
digital integrated circuits; fault trees; integrated circuit reliability; nanotechnology; software reliability; digital nanometer cirucuits; fault trees; integrated circuit reliability; software reliability;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2007.906781
Filename
4298228
Link To Document