DocumentCode
1113046
Title
A Moving Average Non-Homogeneous Poisson Process Reliability Growth Model to Account for Software with Repair and System Structures
Author
Wang, Wen-Li ; Hemminger, Thomas L. ; Tang, Mei-Huei
Author_Institution
Penn State Erie the Behrend Coll., Erie
Volume
56
Issue
3
fYear
2007
Firstpage
411
Lastpage
421
Abstract
We develop a moving average non-homogeneous Poisson process (MA NHPP) reliability model which includes the benefits of both time domain, and structure based approaches. This method overcomes the deficiency of existing NHPP techniques that fall short of addressing repair, and internal system structures simultaneously. Our solution adopts a MA approach to cover both methods, and is expected to improve reliability prediction. This paradigm allows software components to vary in nature, and can account for system structures due to its ability to integrate individual component reliabilities on an execution path. Component-level modeling supports sensitivity analysis to guide future upgrades, and updates. Moreover, the integration capability is a benefit for incremental software development, meaning only the affected portion needs to be re-evaluated instead of the entire package, facilitating software evolution to a higher extent than with other methods. Several experiments on different system scenarios and circumstances are discussed, indicating the usefulness of our approach.
Keywords
moving average processes; reliability theory; sensitivity analysis; software reliability; stochastic processes; convolution; moving average nonhomogeneous Poisson process; reliability growth model; repair; sensitivity analysis; software reliability; system structures; Information science; Maximum likelihood estimation; Packaging; Probability density function; Programming; Sensitivity analysis; Software architecture; Software packages; Software reliability; Testing; Convolution; moving average non-homogeneous Poisson process; sensitivity analysis; software reliability; system structures;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2007.903119
Filename
4298252
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