• DocumentCode
    1113491
  • Title

    Development of SQUID-Based System for Nondestructive Evaluation

  • Author

    Nagendran, R. ; Janawadkar, M.P. ; Pattabiraman, M. ; Jayapandian, J. ; Baskaran, R. ; Vaidhyanathan, L.S. ; Hariharan, Y. ; Nagesha, A. ; Valsan, M. ; Rao, K.B.S. ; Raj, Bhiksha

  • Author_Institution
    Indira Gandhi Centre for Atomic Res., Kalpakkam
  • Volume
    17
  • Issue
    3
  • fYear
    2007
  • Firstpage
    3824
  • Lastpage
    3829
  • Abstract
    This article describes the development of a superconducting quantum interference device (SQUID)-based system for nondestructive evaluation. The setup incorporates an in-house developed thin-film-based Nb SQUID with readout flux locked loop electronics and consists of a liquid helium cryostat with adjustable stand-off distance, a precision XY- thetas scanner for studying both flat and cylindrical samples, and a data acquisition system. The system has been used for the detection of artificially engineered subsurface defects in aluminum plates and to track magnetic-to-nonmagnetic phase transformation in stainless steel [grade 316L(N)] weldment specimens subjected to low cycle fatigue deformation.
  • Keywords
    SQUIDs; aluminium; deformation; eddy current testing; fatigue; magnetic transitions; plates (structures); stainless steel; welds; 316L(N) stainless steel; Al; SQUID-Based System; aluminum plates; data acquisition system; eddy current testing; liquid helium cryostat; low cycle fatigue deformation; magnetic-nonmagnetic phase transformation; nondestructive evaluation; readout flux locked loop electronics; stainless steel weldment specimens; superconducting quantum interference device; Aluminum; Data acquisition; Helium; Interference; Magnetic flux; Niobium; Phase detection; SQUIDs; Superconducting devices; Superconducting magnets; Eddy current testing; fatigue; nondestructive evaluation; superconducting quantum interference device (SQUID); weldment;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.902112
  • Filename
    4298926