DocumentCode
1113513
Title
Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions
Author
Reddy, Sudhakar M. ; Wilson, James R.
Author_Institution
Department of Electrical Engineering, University of Iowa
Issue
1
fYear
1974
Firstpage
98
Lastpage
100
Abstract
Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.
Keywords
Easily testable networks, multiple faults, single faults, stuck-at-faults, symmetric functions, threshold functions.; Cellular networks; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Input variables; Logic arrays; Logic functions; Logic testing; Tin; Easily testable networks, multiple faults, single faults, stuck-at-faults, symmetric functions, threshold functions.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1974.223787
Filename
1672380
Link To Document