Title :
Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions
Author :
Reddy, Sudhakar M. ; Wilson, James R.
Author_Institution :
Department of Electrical Engineering, University of Iowa
Abstract :
Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.
Keywords :
Easily testable networks, multiple faults, single faults, stuck-at-faults, symmetric functions, threshold functions.; Cellular networks; Circuit faults; Circuit testing; Cities and towns; Electrical fault detection; Input variables; Logic arrays; Logic functions; Logic testing; Tin; Easily testable networks, multiple faults, single faults, stuck-at-faults, symmetric functions, threshold functions.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.223787
