• DocumentCode
    1113542
  • Title

    Latch-up ring design guidelines to improve electrostatic discharge (ESD) protection scheme efficiency

  • Author

    Trémouilles, David ; Bafleur, Marise ; Bertrand, Géraldine ; Nolhier, Nicolas ; Mauran, Nicolas ; Lescouzères, Lionel

  • Author_Institution
    LAAS-CNRS, Toulouse, France
  • Volume
    39
  • Issue
    10
  • fYear
    2004
  • Firstpage
    1778
  • Lastpage
    1782
  • Abstract
    In this paper, we show how latch-up guard rings, surrounding electrostatic discharges (ESD) protection devices, can reduce the overall performance of the ESD protection scheme. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.
  • Keywords
    electrostatic discharge; integrated circuit design; technology CAD (electronics); ESD protection devices; TCAD simulation and; electrostatic discharge protection; latch-up guard rings; latch-up ring design guidelines; CMOS technology; Circuit simulation; Circuit testing; Clamps; Electrostatic discharge; Guidelines; Integrated circuit technology; Protection; Rails; Robustness;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2004.833764
  • Filename
    1337010
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1113542