• DocumentCode
    1113691
  • Title

    Study of delay times contributing to the ftof bipolar transistors

  • Author

    Roulston, David J. ; Hebert, François

  • Author_Institution
    University of Waterloo, Waterloo, Ont., Canada
  • Volume
    7
  • Issue
    8
  • fYear
    1986
  • fDate
    8/1/1986 12:00:00 AM
  • Firstpage
    461
  • Lastpage
    462
  • Abstract
    Delay times contributing to the value of transition frequency ftof a bipolar transistor are determined from computer analysis for a typical integrated circuit device. The computed ftvalues are compared with experimental data.
  • Keywords
    Bipolar transistors; Capacitance measurement; Circuit analysis computing; Current density; Delay effects; Doping; Electrical resistance measurement; Frequency; Poisson equations; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26439
  • Filename
    1486262
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1113691