• DocumentCode
    1113816
  • Title

    Induced base transistor fabricated by molecular beam epitaxy

  • Author

    Chang, Chun-Yen ; Liu, W.C. ; Jame, M.S. ; Wang, Y.H. ; Luryi, Serge ; Sze, Simon M.

  • Author_Institution
    National Cheng Kung University, Taiwan, Republic of China
  • Volume
    7
  • Issue
    9
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    497
  • Lastpage
    499
  • Abstract
    A novel three-terminal hot-electron device, the induced base transistor (IBT), has been fabricated by molecular beam epitaxy (MBE). Two-dimensional electron gas (2-DEG) induced by the applied collector field in an undoped GaAs quantum well is used as the base of the IBT. The common-base current gain α has been achieved as high as 0.96 under a collector bias of 2.5 V and an emitter current of 3 mA.
  • Keywords
    Electrons; Etching; Fabrication; Gallium arsenide; Molecular beam epitaxial growth; Molecular beams; Ohmic contacts; Quantum well devices; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26451
  • Filename
    1486274