Simple method for estimating the memory diagram in single mode semiconductor lasers

The authors propose a simple method, based on the probability distribution functions of the switch-on time, to predict the appearance of pattern effects at the output of single-mode semiconductor lasers. The method allows one to evaluate the overlap between the switch-on time probability distribution functions under repetitive gain-switching and periodic `...1111...´ sequences of input bits in the return to zero scheme for any operating point of the laser. If the overlap is large enough, no-pattern effects will appear at the output when the laser is modulated with a pseudorandom sequences of input bits. If the contrary happens, pattern effects will be observed at the output. Nonmemory bands in the memory region are also obtained