Title :
A 0.016 mm
, 2.4 GHz RF Signal Quality Measurement Macro for RF Test and Diagnosis
Author :
Nose, Koichi ; Mizuno, Masayuki
Author_Institution :
NEC, Sagamihara
fDate :
4/1/2008 12:00:00 AM
Abstract :
Our RF signal-quality measurement macro employs 1) a new window-shifting measurement technique that obtains the power of a high-frequency component on the basis of lower-frequency measurements, and 2) a new stair-like weighted addition technique that decreases error due to harmonic power, phase, and DC offset in measured signals. The macro occupies only 1/10 the area of conventional on-chip spectrum analyzers. Carrier power for 2.4 GHz-Tx was successfully measured with digital testers alone, with an error of only <1 dB, and harmonic-emission exceeding FCC regulations (> -20 dBm) was also successfully detected.
Keywords :
circuit testing; harmonic analysis; signal processing; DC offset; RF diagnosis; RF signal quality measurement macro; RF signal-quality measurement macro; RF test; carrier power; digital testers; harmonic power; harmonic-emission; high-frequency component; lower-frequency measurements; on-chip spectrum analyzers; stair-like weighted addition; window-shifting measurement; Automatic testing; Circuit testing; Frequency measurement; Phase measurement; Power harmonic filters; Power measurement; Power system harmonics; Radio frequency; Semiconductor device measurement; System testing; Harmonic analysis; radio-frequency testing; spectrum measurement;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2008.917566