Title :
Comments on "Cause-Effect Analysis for Multiple Fault Detection in Combinational Networks"
Author :
Latino, Carl D. ; Bredeson, Jon G.
Author_Institution :
Department of Electrical Engineering, Pennsylvania State University
Abstract :
Bosson and Hong1 have developed an effective procedure for multiple fault detection. However, their claim that their procedure gives near-minimal results is not necessarily the case.
Keywords :
Automatic testing; Circuit faults; Circuit testing; Electrical fault detection; Equations; Fault detection; Fault tolerance; Intelligent networks; Notice of Violation; Test pattern generators;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.223859
