• DocumentCode
    111427
  • Title

    Graphene Field-Effect Transistors for Radio-Frequency Flexible Electronics

  • Author

    Petrone, Nicholas ; Meric, Inanc ; Chari, Tarun ; Shepard, Kenneth L. ; Hone, James

  • Author_Institution
    Mech. Eng. Dept., Columbia Univ., New York, NY, USA
  • Volume
    3
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan. 2015
  • Firstpage
    44
  • Lastpage
    48
  • Abstract
    Flexible radio-frequency (RF) electronics require materials which possess both exceptional electronic properties and high-strain limits. While flexible graphene field-effect transistors (GFETs) have demonstrated significantly higher strain limits than FETs fabricated from thin films of Si and III-V semiconductors, to date RF performance has been comparatively worse, limited to the low GHz frequency range. However, flexible GFETs have only been fabricated with modestly scaled channel lengths. In this paper, we fabricate GFETs on flexible substrates with short channel lengths of 260 nm. These devices demonstrate extrinsic unity-power-gain frequencies, fmax, up to 7.6 GHz and strain limits of 2%, representing strain limits an order of magnitude higher than the flexible technology with next highest reported fmax.
  • Keywords
    III-V semiconductors; elemental semiconductors; field effect transistors; flexible electronics; graphene devices; radiofrequency integrated circuits; semiconductor thin films; silicon; GFET; III-V semiconductors; Si; Si thin films; electronic properties; extrinsic unity-power-gain frequency; flexible graphene field effect transistors; flexible substrates; high strain limits; radiofrequency flexible electronics; scaled channel lengths; short channel lengths; size 260 nm; Graphene; Logic gates; Performance evaluation; Radio frequency; Strain; Substrates; Transistors; Chemical vapor deposition (CVD); FET; chemical vapor deposition (CVD); flexible electronics; grapheme; graphene; radio-frequency (RF);
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2014.2363789
  • Filename
    6926743