Title :
Microwave performance of a quarter-micrometer gate low-noise pseudomorphic InGaAs/AlGaAs modulation-doped field effect transistor
Author :
Henderson, T. ; Aksun, M.I. ; Peng, C.K. ; Morkoc, H. ; Chao, P.C. ; Smith, Phillip M. ; Duh, K.H.G. ; Lester, L.F.
Author_Institution :
University of Illinois at Urbana-Champaign, Urbana, IL
fDate :
12/1/1986 12:00:00 AM
Abstract :
We report excellent dc and millimeter-wave performance in In0.15Ga0.85As/Al0.15Ga0.85As pseudomorphic modulation-doped field effect transistors (MODFET´s) with 0.25-µm-length gates. Extrinsic transconductances as high as 495 mS/mm at 300 K and unprecedented power performance in the 60-GHz range were observed. Although not yet optimized, excellent low noise characteristics, 0.9 dB, with an associated gain of 10.4 dB at 18 GHz, and a noise figure of 2.4 dB with an associated gain of 4.4 dB at 62 GHz were obtained. This is the best noise performance ever reported for a MODFET in this frequency range. These results clearly demonstrate the superiority of pseudomorphic MODFET structures in high-frequency applications.
Keywords :
Carrier confinement; Cryogenics; Epitaxial layers; Gain; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Noise figure; Temperature;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1986.26507