Title :
Low-temperature CMOS 8 × 8 bit multipliers with sub-10-ns speeds
Author :
Hanamura, Shoji ; Aoki, Masaaki ; Masuhara, Toshiaki ; Minato, Osamu ; Sakai, Yoshio ; Hayashida, Tetsuya
Author_Institution :
Hitachi Ltd., Kokubunji, Tokyo, Japan
fDate :
1/1/1987 12:00:00 AM
Abstract :
Low-temperature (77, 4.2 K) operation is proposed for bulk CMOS devices for use in super-fast VLSI applications. Symmetrical variations of both types of MOSFET parameters with respect to temperature and latchup immunity make CMOS a very promising device technology at low temperatures. To demonstrate the performance advantage of circuit operation at low temperatures, multipliers with two different circuit configurations are designed and fabricated with a gate length of 1.3 µm. Multiplication speeds of 8.0 and 6.6 ns are obtained with CMOS circuit configurations at 4.2 K and with pulsed-p-load/CMOS circuit configurations at 77 K, respectively.
Keywords :
CMOS technology; Gallium arsenide; Inverters; MOS devices; Nitrogen; Packaging; Power dissipation; Silicon; Temperature; Very large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.22890