• DocumentCode
    1114854
  • Title

    Asynchronous Sequential Machines Designed for Fault Detection

  • Author

    Sawin, Dwight H., III ; Maki, Gary K.

  • Author_Institution
    Naval Electronics Laboratory Center
  • Issue
    3
  • fYear
    1974
  • fDate
    3/1/1974 12:00:00 AM
  • Firstpage
    239
  • Lastpage
    249
  • Abstract
    A design procedure is presented which allows for detection of faults in asynchronous sequential machines in a real time environment. Faults affecting both the output states and the internal operation of the machine are detected. The class of faults initially considered are single stuck-at-1 and stuck-at-0 faults. However, since the detection system presented is static and continuous, the class of faults detected will be greatly extended to include intermittent and a large number of multiple faults.
  • Keywords
    Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.; Built-in self-test; Circuit faults; Electrical fault detection; Equations; Fault detection; Impedance matching; Logic circuits; Logic design; Sequential analysis; Testing; Asynchronous sequential machine design, fault detection, fault masking, reliability, self-testable machines.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1974.223918
  • Filename
    1672511