• DocumentCode
    1115011
  • Title

    Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports

  • Author

    Lott, Urs

  • Author_Institution
    Swiss Federal Inst. of Technol., Zurich, Switzerland
  • Volume
    37
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1506
  • Lastpage
    1511
  • Abstract
    A method for simultaneously measuring the magnitude and phase of the harmonics generated by a microwave two-port is reported. The two-port under test is driven with a sinusoidal microwave signal strong enough to force it into nonlinear operation. Its output harmonics are measured in the frequency domain with a setup that includes a vector network analyzer. For phase calibration at the harmonic frequencies, a millimeter-wave Schottky diode is used as a reference device. The system allows the measurement of harmonics with a phase accuracy of about ±10° at 20 GHz (referred to f1=5 GHz). It can be built for any frequency (<40 GHz) at which a vector network analyzer and a suitable signal generator with multiplier are available. For low-amplitude harmonics, higher sensitivity compared to time-domain measurements with a sampling scope results in better measurement accuracy. The accuracy should improve further if the nonideality of the diode reference circuit is characterized more precisely
  • Keywords
    Schottky gate field effect transistors; harmonics; microwave measurement; multiport networks; phase measurement; semiconductor device testing; solid-state microwave devices; 40 GHz; EHF; MESFET; SHF; diode reference circuit; frequency domain; magnitude measurement; millimeter-wave Schottky diode; nonlinear microwave two-ports; output harmonics; phase calibration; phase measurement; semiconductor microwave devices; sinusoidal microwave signal; vector network analyzer; Frequency domain analysis; Frequency measurement; Harmonic analysis; Microwave devices; Microwave generation; Microwave measurements; Microwave theory and techniques; Phase measurement; Schottky diodes; Testing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.40993
  • Filename
    40993