Title :
Comments on "Multiple Fault Detection in Combinational Networks"
Author :
Goel, Prabhakar ; Siewiorek, Daniel P.
Author_Institution :
Systems Products Division, IBM Corporation
fDate :
3/1/1974 12:00:00 AM
Abstract :
Some comments on a recent contribution on multiple fault detection using test sets for single fault detection are presented. A counter example that shows some defects in generalizing from a tree to an arbitrary network are also included.
Keywords :
Combinational networks, fan-out, multiple faults, single fault detection set.; Circuit faults; Computer science; Counting circuits; Electrical fault detection; Fault detection; Helium; Intelligent networks; Testing; Combinational networks, fan-out, multiple faults, single fault detection set.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1974.223937
