• DocumentCode
    1115177
  • Title

    Testing for Faults in Wiring Networks

  • Author

    Kautz, William H.

  • Author_Institution
    Stanford Research Institute
  • Issue
    4
  • fYear
    1974
  • fDate
    4/1/1974 12:00:00 AM
  • Firstpage
    358
  • Lastpage
    363
  • Abstract
    An algorithm is derived for multiprobe testing for shorts, opens, and wiring errors in any multiterminal wiring network, such as a printed circuit board, wiring harness, multiconductor cable, or backplane wiring board. For behavioral testing the minimum number of tests required, always achievable, is equal to p - 1 + [log2q], where p is the number of terminals in the largest interconnected cluster in the network, and q is the total number of clusters, including isolated terminals. For structural testing the number of tests required is less, and can be as small as [log2q] + 1 depending upon the assumptions made regarding the types of faults that can occur.
  • Keywords
    Behavioral testing, faults, structural testing, switching circuits, wiring networks.; Backplanes; Circuit faults; Circuit testing; Integrated circuit interconnections; Intelligent networks; Logic testing; Printed circuits; Switching circuits; Tree graphs; Wiring; Behavioral testing, faults, structural testing, switching circuits, wiring networks.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1974.223950
  • Filename
    1672543