DocumentCode
1115204
Title
Modeling of ambipolar a-Si:H thin-film transistors
Author
Neudeck, Gerold W. ; Bare, Harold F. ; Chung, Kyo Y.
Author_Institution
Purdue University, West Lafayette, IN
Volume
34
Issue
2
fYear
1987
fDate
2/1/1987 12:00:00 AM
Firstpage
344
Lastpage
350
Abstract
Ambipolar hydrogenated amorphous silicon thin-film transistors are capable of both n- and p-channel device operation. Essential to the fabrication of such devices are ohmic source-drain contact regions and a high-quality low fixed charge gate insulator. A simple model has been developed to describe the output drain current versus drain voltage characteristics of these ambipolar devices, The model involves only the numerical integration of an interpolated sheet conductance function. By using the appropriate flat-band voltage, the model accurately predicts the experimental output drain current characteristics for both n- and p-type operation.
Keywords
Amorphous silicon; Charge carrier processes; FETs; Helium; Insulation; Sensor arrays; Silicon compounds; Substrates; Thin film transistors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1987.22928
Filename
1486639
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