• DocumentCode
    1115204
  • Title

    Modeling of ambipolar a-Si:H thin-film transistors

  • Author

    Neudeck, Gerold W. ; Bare, Harold F. ; Chung, Kyo Y.

  • Author_Institution
    Purdue University, West Lafayette, IN
  • Volume
    34
  • Issue
    2
  • fYear
    1987
  • fDate
    2/1/1987 12:00:00 AM
  • Firstpage
    344
  • Lastpage
    350
  • Abstract
    Ambipolar hydrogenated amorphous silicon thin-film transistors are capable of both n- and p-channel device operation. Essential to the fabrication of such devices are ohmic source-drain contact regions and a high-quality low fixed charge gate insulator. A simple model has been developed to describe the output drain current versus drain voltage characteristics of these ambipolar devices, The model involves only the numerical integration of an interpolated sheet conductance function. By using the appropriate flat-band voltage, the model accurately predicts the experimental output drain current characteristics for both n- and p-type operation.
  • Keywords
    Amorphous silicon; Charge carrier processes; FETs; Helium; Insulation; Sensor arrays; Silicon compounds; Substrates; Thin film transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.22928
  • Filename
    1486639