DocumentCode
1115327
Title
Detecting properties of YBaCuO thin film bridges
Author
Tavkhelidze, A.N. ; Kuzmin, L.S. ; Soldatov, E.S. ; Okhrimenco, V.N. ; Kovalev, A.S. ; Seleznev, B.V. ; Pirogov, V.G.
Author_Institution
Moscow State Univ., USSR
Volume
27
Issue
2
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
2456
Lastpage
2459
Abstract
A study is made of the properties of YBaCuO superconducting microbridges. They were fabricated by both direct photolithographic techniques and focused laser beam patterning. The YBaCuO thin films were deposited onto ZrO2, MgO, and SrTiO3 substrates by laser ablation of a massive YBaCuO target. The Josephson effect was observed in the bridges by detecting Shapiro steps and selective responses under irradiation with a signal frequency of 27-36 GHz. The value of the product I cR N reached 4.5 MV at T =4.2 K and 420 μV at T =77 K. The best values for wideband sensitivity η(T ) and noise-equivalent power NEP(T ) were η(77)=5×103 V/W NEP(77)=2×10-12 W/Hz1/2 η(20)=2.5×106 V/W, and NEP(20)=10-14 W/Hz1/2. The estimation of noise by the width of the selective response shows than the internal noise is 1.5-2.5 times higher than the thermal value
Keywords
Josephson effect; barium compounds; electric sensing devices; electron device noise; high-temperature superconductors; microwave detectors; solid-state microwave devices; superconducting junction devices; superconducting thin films; yttrium compounds; 27 to 36 GHz; 4.2 to 77 K; EHF; Josephson effect; MM-wave detector; Shapiro steps detection; YBaCuO thin film bridges; YBaCuO-MgO; YBaCuO-SrTiO3; YBaCuO-ZrO2; direct photolithographic techniques; focused laser beam patterning; high temperature superconductors; internal noise; massive YBaCuO target; microwave irradiation; millimetre wave detector; superconducting microbridges; Bridges; Josephson effect; Laser ablation; Laser beams; Sputtering; Substrates; Superconducting device noise; Superconducting thin films; Transistors; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.133716
Filename
133716
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