Title :
Simplified RF noise de-embedding method for on-wafer CMOS FET
Author :
Xiong, Y.Z. ; Issaoun, A. ; Nan, L. ; Shi, J. ; Mouthaan, K.
Author_Institution :
Inst. of Microelectron., Singapore
Abstract :
A simplified RF noise de-embedding method for an on-wafer CMOS device using only one dummy structure for simplicity and area reduction is presented. The method describes the use of a ´thru´ test structure to subtract completely the parasitic effects of pads and in/out interconnections from the device under test. A comparison of the de-embedding results among the simplified method and existing de-embedding methods is given, which proves that the new method is effective, accurate and time efficient.
Keywords :
CMOS integrated circuits; field effect transistors; noise; RF noise de-embedding; complementary metal-oxide-semiconductor; field effect transistor; on-wafer CMOS FET; on-wafer CMOS device;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20071442
