DocumentCode
1115951
Title
An Examination of Algebraic Test Generation Methods for Multiple Faults
Author
Carroll, B.D. ; Shah, H.G. ; Jones, D.M.
Author_Institution
Department of Electrical Engineering, Auburn University
Issue
7
fYear
1974
fDate
7/1/1974 12:00:00 AM
Firstpage
743
Lastpage
745
Abstract
A generalized test function (GTF) is derived that gives all tests for a multiple stuck-at fault in a combinational logic circuit. The GTF is then used as the basis for an examination of several algebraic test generation methods that have appeared in the literature. Deficiencies are found in some methods.
Keywords
Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Fault diagnosis; Input variables; Logic testing; Boolean difference, combinational logic circuits, fault diagnosis, multiple faults, test generation.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1974.224024
Filename
1672617
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