• DocumentCode
    1116531
  • Title

    The Boolean Difference and Multiple Fault Analysis

  • Author

    Ku, Chia-tai ; Masson, Gerald M.

  • Author_Institution
    Department of Reliability Engineering, Stromberg-Carlson Corporation
  • Issue
    1
  • fYear
    1975
  • Firstpage
    62
  • Lastpage
    71
  • Abstract
    The Boolean difference is a well-known mathematical concept which has found significant application in the single fault analysis of combinational logic circuits. One of the primary attributes of the Boolean difference in such situations is its completeness. In this paper we extend the Boolean difference concept to cover multiple fault situations. Expressions are developed which give all possible input patterns that can be applied to combinational logic circuits to demonstrate the presence or absence of a specified multiple fault of the stuck-type class. Such expressions are useful in situations where at most, say, p simultaneous faults need be considered, as well as situations where any multiple fault can exist. In addition the expressions developed are also shown to complete some existing single fault analysis concepts.
  • Keywords
    Boolean difference, combinational logic circuits, complete test set, minimal test set, multiple fault analysis.; Algorithm design and analysis; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Digital systems; Helium; Logic testing; Reliability engineering; Boolean difference, combinational logic circuits, complete test set, minimal test set, multiple fault analysis.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224083
  • Filename
    1672676