DocumentCode
1116531
Title
The Boolean Difference and Multiple Fault Analysis
Author
Ku, Chia-tai ; Masson, Gerald M.
Author_Institution
Department of Reliability Engineering, Stromberg-Carlson Corporation
Issue
1
fYear
1975
Firstpage
62
Lastpage
71
Abstract
The Boolean difference is a well-known mathematical concept which has found significant application in the single fault analysis of combinational logic circuits. One of the primary attributes of the Boolean difference in such situations is its completeness. In this paper we extend the Boolean difference concept to cover multiple fault situations. Expressions are developed which give all possible input patterns that can be applied to combinational logic circuits to demonstrate the presence or absence of a specified multiple fault of the stuck-type class. Such expressions are useful in situations where at most, say, p simultaneous faults need be considered, as well as situations where any multiple fault can exist. In addition the expressions developed are also shown to complete some existing single fault analysis concepts.
Keywords
Boolean difference, combinational logic circuits, complete test set, minimal test set, multiple fault analysis.; Algorithm design and analysis; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Digital systems; Helium; Logic testing; Reliability engineering; Boolean difference, combinational logic circuits, complete test set, minimal test set, multiple fault analysis.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1975.224083
Filename
1672676
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