Title :
Reliability of semiconductor lasers and detectors for undersea transmission systems
Author :
Nakano, Yoshinori ; Sudo, Hiromi ; Iwane, Genzo ; Matsumoto, Tadashi ; Ikegami, Tetsuhiko
Author_Institution :
NTT Public Corp., Atsugi-shi, Kanagawa, Japan
fDate :
12/1/1984 12:00:00 AM
Abstract :
This paper reports the strategy for establishing the reliability assurance for LD´s and APD´s available for undersea transmission systems. On the basis of aging data during more than 104h and a statistical analysis for the reliability of semiconductor devices, the LD´s and Ge-APD´s lifetest plans for high reliability assurance are proposed.
Keywords :
Communication system reliability; Optical fiber receivers; Optical fiber transmitters, lasers; Underwater optical fiber systems; Aging; Detectors; Fiber lasers; Oceans; Optical devices; Optical fiber cables; Semiconductor device reliability; Semiconductor devices; Semiconductor lasers; Statistical analysis;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.1984.1073716
