مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1117045

Title :

Special issue on testing VLSI circuits

Volume :

Issue :

fYear :

2004

Firstpage :

1448

Lastpage :

1448

Abstract :

Provides notice of upcoming special issues of interest to practitioners and researchers.

fLanguage :

English

Journal_Title :

Instrumentation and Measurement, IEEE Transactions on

Publisher :

ieee

ISSN :

0018-9456

Type :

jour

DOI :

10.1109/TIM.2004.837032

Filename :

1337304

Link To Document :