DocumentCode :
1117053
Title :
An analytic model for HEMT´s using new velocity-field dependence
Author :
Chang, Chian-sern ; Fetterman, Harold R.
Author_Institution :
University of California, Los Angeles, CA
Volume :
34
Issue :
7
fYear :
1987
fDate :
7/1/1987 12:00:00 AM
Firstpage :
1456
Lastpage :
1462
Abstract :
An analytic model is developed for the output current-voltage characteristics and microwave-signal parameters of high electron mobility transistors (HEMT´s). In this model, the GSW equation is used to approach the behavior of electron drift velocity versus electric field. The resulting I-V curves are in excellent agreement with experimental data. In order to predict the microwave performance of these devices, this model is then used to derive the small-signal parameters, transconductance, channel conductance, and gate capacitance.
Keywords :
Contact resistance; Electron mobility; Gallium arsenide; HEMTs; Integrated circuit modeling; Microwave devices; Microwave transistors; Poisson equations; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.23106
Filename :
1486817
Link To Document :
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