DocumentCode :
1117300
Title :
Finite-state Markov modeling of correlated Rician-fading channels
Author :
Pimentel, Cecilio ; Falk, Tiago H. ; Lisbôa, Luciano
Author_Institution :
Commun. Res. Group, Fed. Univ. of Pernambuco, Recife, Brazil
Volume :
53
Issue :
5
fYear :
2004
Firstpage :
1491
Lastpage :
1501
Abstract :
Stochastic properties of the binary channel that describe the successes and failures of the transmission of a modulated signal over a time-correlated flat-fading channel are considered for investigation. This analysis is employed to develop Kth-order Markov models for such a burst channel. The order of the Markov model that generates accurate analytical models is estimated for a broad range of fading environments. The parameterization and accuracy of an important class of hidden Markov models, known as the Gilbert-Elliott channel (GEC), are also investigated. Fading rates are identified in which the Kth-order Markov model and the GEC model approximate the fading channel with similar accuracy. The latter model is useful for approximating slowly fading processes, since it provides a more compact parameterization.
Keywords :
Rayleigh channels; Rician channels; channel estimation; correlation methods; discrete systems; error statistics; finite state machines; frequency shift keying; hidden Markov models; mobile communication; Rayleigh fading channel; binary channel; burst channel; codeword error probability; correlated Rician-fading channel; discrete communication system; finite-state Markov modeling; frequency-shift keying modulator; hidden Markov models; parameter estimation; parameterization; stochastic properties; time-correlated flat-fading channel; Brazil Council; Communication systems; Demodulation; Error analysis; Fading; Frequency shift keying; Hidden Markov models; Markov processes; Power capacitors; Signal processing; Flat fading; GECs; Gilbert–Elliott channels; Markov processes; parameter estimation; statistics of burst channels;
fLanguage :
English
Journal_Title :
Vehicular Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9545
Type :
jour
DOI :
10.1109/TVT.2004.832413
Filename :
1337327
Link To Document :
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