• DocumentCode
    11174
  • Title

    Diffraction-Compensating Coded Aperture for Inspection in Manufacturing

  • Author

    Sakuyama, Tsutomu ; Funatomi, Takuya ; Iiyama, Masaaki ; Minoh, Michihiko

  • Author_Institution
    Dainippon Screen Manuf. Co. Ltd., Kyoto, Japan
  • Volume
    11
  • Issue
    3
  • fYear
    2015
  • fDate
    Jun-15
  • Firstpage
    782
  • Lastpage
    789
  • Abstract
    In this paper, we adopt the coded aperture technique to the alignment process for industrial machinery. As a special setting for assembly and inspection, such machinery uses an illumination of narrow wavelength range for imaging with less aberration. This leads to significant influence of light diffraction on the image restoration. Although the diffraction was treated as negligible in most previous studies of coded aperture since they were carried out for natural images, the aperture patterns of them do not achieve enough accuracy for the alignment. We optimize the aperture pattern by performing a simulation of light diffraction, and we experimentally show that it achieves better performance in the alignment.
  • Keywords
    assembling; automatic optical inspection; image matching; image restoration; light diffraction; production engineering computing; aberration; alignment process; aperture pattern optimization; assembly technique; diffraction-compensating coded aperture technique; image restoration; industrial machinery; inspection technique; light diffraction; light diffraction simulation; natural images; wavelength range; Accuracy; Apertures; Cameras; Diffraction; Image restoration; Machinery; Alignment; coded aperture; factory automation; image restoration; industrial machinery; inspection; light diffraction; template matching;
  • fLanguage
    English
  • Journal_Title
    Industrial Informatics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1551-3203
  • Type

    jour

  • DOI
    10.1109/TII.2014.2342374
  • Filename
    6871319