DocumentCode :
11174
Title :
Diffraction-Compensating Coded Aperture for Inspection in Manufacturing
Author :
Sakuyama, Tsutomu ; Funatomi, Takuya ; Iiyama, Masaaki ; Minoh, Michihiko
Author_Institution :
Dainippon Screen Manuf. Co. Ltd., Kyoto, Japan
Volume :
11
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
782
Lastpage :
789
Abstract :
In this paper, we adopt the coded aperture technique to the alignment process for industrial machinery. As a special setting for assembly and inspection, such machinery uses an illumination of narrow wavelength range for imaging with less aberration. This leads to significant influence of light diffraction on the image restoration. Although the diffraction was treated as negligible in most previous studies of coded aperture since they were carried out for natural images, the aperture patterns of them do not achieve enough accuracy for the alignment. We optimize the aperture pattern by performing a simulation of light diffraction, and we experimentally show that it achieves better performance in the alignment.
Keywords :
assembling; automatic optical inspection; image matching; image restoration; light diffraction; production engineering computing; aberration; alignment process; aperture pattern optimization; assembly technique; diffraction-compensating coded aperture technique; image restoration; industrial machinery; inspection technique; light diffraction; light diffraction simulation; natural images; wavelength range; Accuracy; Apertures; Cameras; Diffraction; Image restoration; Machinery; Alignment; coded aperture; factory automation; image restoration; industrial machinery; inspection; light diffraction; template matching;
fLanguage :
English
Journal_Title :
Industrial Informatics, IEEE Transactions on
Publisher :
ieee
ISSN :
1551-3203
Type :
jour
DOI :
10.1109/TII.2014.2342374
Filename :
6871319
Link To Document :
بازگشت