DocumentCode :
111747
Title :
Thermal Analysis of Eutectic Flip-Chip Light-Emitting Diodes Fabricated Using Copper-Coated Ceramic Substrate
Author :
Chien-Ping Wang ; Shang-Ping Ying ; Yi-Ching Su ; Tien-Li Chang
Author_Institution :
Dept. of Mech. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
Volume :
62
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
2524
Lastpage :
2527
Abstract :
Die attachment quality plays a remarkable role in producing highly reliable solid-state lighting fixtures by providing a dominant impact on thermal resistance. Color rendering, efficacy, and lifetime are strongly related to junction temperature. This paper investigated the effects of varying the thickness of sputter-coated copper on an Al2O3 ceramic substrate on the thermal resistance and luminous intensity of flip-chip light-emitting diode (LED) devices. Eutectic bonding was applied to provide excellent bonding strength and low void content between the chip and ceramic substrate. The thermal resistance dramatically decreased as the copper thickness was reduced because of a substantial reduction in the conduction impedance for heat dissipation from the junction to the ambient. The luminous intensity was improved by reducing the copper thickness as the driving current was increased from 50 to 700 mA. The results demonstrated that reducing the copper thickness effectively reduced the junction temperature and improved the performance of the eutectic flip-chip bonding LED devices.
Keywords :
LED lamps; aluminium compounds; bonding processes; brightness; ceramics; copper; eutectic structure; flip-chip devices; sputtered coatings; thermal analysis; thermal resistance; Cu-Al2O3; bonding strength; copper coated ceramic substrate; die attachment quality; eutectic bonding; eutectic flip-chip light emitting diodes; luminous intensity; solid state lighting fixtures; sputter coated copper; thermal resistance; Ceramics; Copper; Junctions; Light emitting diodes; Substrates; Thermal resistance; Eutectic bond; light-emitting diode (LED); thermal resistance; thermal resistance.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2443136
Filename :
7132733
Link To Document :
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