• DocumentCode
    1117475
  • Title

    An Improved Algorithm for Testing the Planarity of a Graph

  • Author

    Rubin, Frank

  • Author_Institution
    Systems Development Division, IBM Corporation
  • Issue
    2
  • fYear
    1975
  • Firstpage
    113
  • Lastpage
    121
  • Abstract
    Hopcroft and Tarjan [2] have recently proposed an algorithm that runs in linear time for testing the planarity of a graph. The technique finds a representation of the graph as a sequence of paths and then iteratively imbeds these paths to find a mesh structure, rearranging the meshes as needed to accommodate each new path. Demoucron et al. [1] have shown that this rearrangement process is unnecessary if the paths are considered in the proper order. The present implementation is found to run in linear time for most ordinary cases, about twice as fast as Tarjan´s Algol implementation. A graph of 3000 vertices and 8994 edges required about 18 s.
  • Keywords
    Graph theory, imbedding, planar graphs, planar representations, printed circuits.; Circuit testing; Iterative algorithms; Printed circuits; Graph theory, imbedding, planar graphs, planar representations, printed circuits.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224179
  • Filename
    1672772