DocumentCode :
1117475
Title :
An Improved Algorithm for Testing the Planarity of a Graph
Author :
Rubin, Frank
Author_Institution :
Systems Development Division, IBM Corporation
Issue :
2
fYear :
1975
Firstpage :
113
Lastpage :
121
Abstract :
Hopcroft and Tarjan [2] have recently proposed an algorithm that runs in linear time for testing the planarity of a graph. The technique finds a representation of the graph as a sequence of paths and then iteratively imbeds these paths to find a mesh structure, rearranging the meshes as needed to accommodate each new path. Demoucron et al. [1] have shown that this rearrangement process is unnecessary if the paths are considered in the proper order. The present implementation is found to run in linear time for most ordinary cases, about twice as fast as Tarjan´s Algol implementation. A graph of 3000 vertices and 8994 edges required about 18 s.
Keywords :
Graph theory, imbedding, planar graphs, planar representations, printed circuits.; Circuit testing; Iterative algorithms; Printed circuits; Graph theory, imbedding, planar graphs, planar representations, printed circuits.;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/T-C.1975.224179
Filename :
1672772
Link To Document :
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