Title :
Detection oF Pattern-Sensitive Faults in Random-Access Memories
Author_Institution :
Department of Electrical Engineering and the Computer Science Program, University of Southern California
Abstract :
Some formal models for pattern-sensitive faults (PSF´s) in random-access memories are presented. The problem of detecting unrestricted PSF´s is that of constructing a checking sequence for the memory. An efficient procedure for constructing such a checking sequence is presented. A local PSF is defined as a PSF where the faulty behavior of a memory cell Cidepends on a fixed group of cells called the neighborhood of Ci. Neighborhoods are divided into two classes, open and closed. Test generation methods are described for local PSF´s defined on both open and closed neighborhoods. The detection of PSF´s when only one memory cell is faulty (single PSF´s) is also discussed.
Keywords :
Checking experiments, fault detection, pattern-sensitive faults, random-access memories.; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Integrated circuit technology; Large scale integration; Legged locomotion; Read-write memory; Semiconductor device manufacture; Semiconductor memory; Checking experiments, fault detection, pattern-sensitive faults, random-access memories.;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/T-C.1975.224182
