Title :
Critical currents of semiconductor-coupled Josephson weak links
Author :
Kleinsasser, A.W.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
Critical currents of semiconductor-coupled Josephson weak links, including Josephson field effect transistors, are discussed with emphasis on experimental results. Phenomenological expressions are used illuminate outstanding issues. Recent experiments are described which could lead to improved understanding of the superconductor-semiconductor interfaces of key importance in these devices
Keywords :
Josephson effect; critical currents; field effect transistors; superconducting junction devices; Josephson field effect transistors; semiconductor-coupled Josephson weak links; superconductor-semiconductor interfaces; Boundary conditions; Charge carrier density; Critical current; FETs; Insulation; Proximity effect; Superconducting devices; Superconducting materials; Tin; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
