• DocumentCode
    1117721
  • Title

    Status on the Sphinx Machine Based on the 1- \\mu \\hbox {s} LTD Technology

  • Author

    Lassalle, F. ; Loyen, A. ; Georges, A. ; Roques, B. ; Calamy, H. ; Mangeant, C. ; Cambonie, J.-F. ; Laspalles, S. ; Cadars, D. ; Rodriguez, G. ; Delchie, J.-M. ; Combes, P. ; Lample, R. ; Chanconie, T. ; Saves, J.

  • Author_Institution
    Centre d´Etudes de Gramat, Gramat
  • Volume
    36
  • Issue
    2
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    370
  • Lastpage
    377
  • Abstract
    The Sphinx machine developed at the Centre d´Etudes de Gramat is based on the 1-mus linear-transformer-driver (LTD) technology. Before 2006, it operated with 16 branches of eight LTD stages each and was used for implosion of Z-pinch loads in direct drive mode. At a charging voltage of 50 kV, the stored energy was 1.3 MJ, and the good reliability of the machine allowed many experiments on 4-MA 700-ns implosion of nested wire arrays. Parallel to these experiments, improvements on LTD stages have been achieved on test beds up to 70-kV charging voltage, leading to a new design of LTD stage, named LTD-05. The Sphinx machine has been upgraded with 144 such LTD-05 stages. Details are given on stage design, on electrical and electrostatic simulations, and on experimental results. The following subsystems modifications or developments are also described: (1) premagnetizing and triggering systems and (2) prepulse current generator for wire-array preheating. Moreover, a status on improved performances and reliability of the complete Sphinx system is given.
  • Keywords
    Z pinch; Sphinx machine; X-ray production; Z-pinch; charging voltage; electrical simulation; electrostatic simulation; linear-transformer-driver; nested wire arrays; premagnetizing systems; prepulse current generator; time 1 mus to 700 ns; triggering systems; voltage 50 kV; wire-array preheating; Breakdown voltage; Bridge circuits; Dielectrics and electrical insulation; Electrodes; Electrostatics; Power system reliability; Power system simulation; Switches; Testing; Wire; Current; X-ray production; plasma pinch; pulse power systems; switches; transformers;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.918659
  • Filename
    4480823