• DocumentCode
    1117723
  • Title

    Electrical and physical modeling of contact defects due to fretting

  • Author

    Boyer, L. ; Houzé, F. ; Klimek, G. ; Noël, S.

  • Author_Institution
    Lab. de Genie Electr. de Paris, Ecole Superieure d´´Electr., Gif-sur-Yvette, France
  • Volume
    17
  • Issue
    1
  • fYear
    1994
  • fDate
    3/1/1994 12:00:00 AM
  • Firstpage
    134
  • Lastpage
    140
  • Abstract
    When the two members of an electrical contact are driven in low-amplitude alternating motion relative to each other, the resulting tribological phenomena may cause an interface to become poorly conductive. If the contact carries low-level signals such as a pulse train, and reaches this stage of degradation, it may deform the signals enough to make them unusable. The present article first describes an experiment in which a signal transmitted through a vibrating contact is compared with an undistorted reference. It is then shown, using theory supported by experiment, that a faulty contact can be modeled by an equivalent resistor and capacitor in parallel. We then attempt to develop a physical model of a contact interface as a third body of variable thickness and find analytical expressions for the contact resistance and capacitance, providing a basis for analyzing the experimental results. This analysis shows that, for the faults observed, the contact interface probably consists of an insulating layer with or without a metallic bridge of very small lateral dimensions passing through it
  • Keywords
    contact resistance; electrical contacts; equivalent circuits; interface phenomena; modelling; vibrations; wear; capacitance; contact defects; contact degradation; contact interface; contact resistance; contact wear; electrical contact; electrical modeling; faulty contact; fretting; insulating layer; low-amplitude alternating motion; metallic bridge; physical model; physical modeling; tribological phenomena; vibrating contact; Capacitance; Capacitors; Contact resistance; Degradation; Insulation; Powders; Resistors; Surface morphology; Surface resistance; Surface topography;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.296379
  • Filename
    296379