• DocumentCode
    1117836
  • Title

    Process optimization using a fuzzy logic response surface method

  • Author

    Xie, H. ; Lee, Y.C. ; Mahajan, R.L. ; Su, R.

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • Volume
    17
  • Issue
    2
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    202
  • Lastpage
    211
  • Abstract
    A new response surface method using fuzzy logic models (FL-RSM) has been proposed. The algorithm starts with a fuzzy logic model (FLM) constructed on the experimental data obtained with design of experiments (DOE). The gradient search method is used with a specified step size, and a confirming experiment is conducted at each step. The search continues until no further improvement in the objective function is observed in that gradient direction. The FLM is trained with the new experimental data combined with the old DOE data, and a new gradient is evaluated. The process is repeated until the working point is close to the optimum, as indicated by a marginal improvement in the objective function. Then the algorithm switches to the optimum search mode. It calculates the optimum based on the model, and a confirming experiment is conducted at the suggested optimum settings. The procedure is repeated until the exit criterion is satisfied. The optimization procedure has been applied to a vertical chemical vapor deposition (CVD) process with various noise levels. The results demonstrate the effectiveness of the proposed FL-RSM. It is similar to the existing regression-model-based RSM approaches. The main difference is that it uses one self-adjusted FLM to replace the combination of linear and nonlinear regression models. As a result, FL-RSM can be more user friendly and efficient in many applications
  • Keywords
    chemical vapour deposition; fuzzy logic; modelling; optimisation; semiconductor process modelling; CVD; exit criterion; fuzzy logic response surface method; gradient direction; gradient search method; linear regression models; noise levels; nonlinear regression models; objective function; optimization procedure; optimum search mode; optimum settings; process optimization; regression-model-based RSM approaches; self-adjusted FLM; step size; user friendly; vertical chemical vapor deposition; Algorithm design and analysis; Analytical models; Chemical vapor deposition; Fuzzy logic; Manufacturing processes; Optimization methods; Response surface methodology; Search methods; Switches; US Department of Energy;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.296401
  • Filename
    296401