DocumentCode :
1117892
Title :
Turn-off processes in high-voltage n-p-ν-n switches
Author :
Widlar, Robert J.
Author_Institution :
Apartado Postal, Puerto Vallarta, Jalisco, Mexico
Volume :
34
Issue :
9
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
2013
Lastpage :
2022
Abstract :
A one-dimensional solution is found for the current-continuity equations that govern minority-carrier removal from the collector region of a saturated bipolar transistor. The shape and position of the charge body is established so that the collector-voltage rise can be predicted, especially in the final stages of turn-off. Constant collector current, corresponding to an inductive load, is assumed during the charge-removal process. The effect of varying the reverse base drive is considered as is turning off from hard- and quasi-saturation. It is shown that the collector region can be swept clear of minority carriers at a collector voltage well below BVCEO. Once minority carriers have been cleared, collector current is supported by a displacement current which causes energy storage, rather than dissipation. Experimental verification is sought with a developmental transistor that minimizes two- and three-dimensional effects. Qualitative agreement is evident; reasonable quantitative agreement does not require unrealistic assumptions. Lastly, the conditions that can precipitate reverse-biased secondary breakdown are identified in an appendix.
Keywords :
Charge carrier processes; Electric breakdown; Electron mobility; Equations; Helium; Kelvin; Permittivity; Silicon; Switches; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1987.23189
Filename :
1486900
Link To Document :
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