• DocumentCode
    1117892
  • Title

    Turn-off processes in high-voltage n-p-ν-n switches

  • Author

    Widlar, Robert J.

  • Author_Institution
    Apartado Postal, Puerto Vallarta, Jalisco, Mexico
  • Volume
    34
  • Issue
    9
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    2013
  • Lastpage
    2022
  • Abstract
    A one-dimensional solution is found for the current-continuity equations that govern minority-carrier removal from the collector region of a saturated bipolar transistor. The shape and position of the charge body is established so that the collector-voltage rise can be predicted, especially in the final stages of turn-off. Constant collector current, corresponding to an inductive load, is assumed during the charge-removal process. The effect of varying the reverse base drive is considered as is turning off from hard- and quasi-saturation. It is shown that the collector region can be swept clear of minority carriers at a collector voltage well below BVCEO. Once minority carriers have been cleared, collector current is supported by a displacement current which causes energy storage, rather than dissipation. Experimental verification is sought with a developmental transistor that minimizes two- and three-dimensional effects. Qualitative agreement is evident; reasonable quantitative agreement does not require unrealistic assumptions. Lastly, the conditions that can precipitate reverse-biased secondary breakdown are identified in an appendix.
  • Keywords
    Charge carrier processes; Electric breakdown; Electron mobility; Equations; Helium; Kelvin; Permittivity; Silicon; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23189
  • Filename
    1486900