DocumentCode :
1117952
Title :
Bifurcation evolution across metal-metal contacts sustaining high charge injection rates
Author :
Dervos, C.T. ; Fitsilis, P.T.
Author_Institution :
Dept. of Electr. Eng., Nat. Tech. Univ. of Athens, Greece
Volume :
17
Issue :
2
fYear :
1994
fDate :
6/1/1994 12:00:00 AM
Firstpage :
286
Lastpage :
294
Abstract :
In real world even the simplest of the electrical components may exhibit unpredictable characteristics, and it seems that the theory of chaos touches all disciplines. In this work, the contact potential instabilities induced by the high electronic injection rates between metal-to-metal contacts are experimentally investigated in an I-V phase space using state-of-the-art data logging systems. The mechanically contacted metals are energized by a sinusoidal power source, and their response is systematically studied within a 50-Hz cycle. The obtained results convincingly demonstrate their chaotic nature. Two entirely different instability types have been observed for such systems. Their classification may lead to a better understanding of negative differential resistance (NDR) formation, which is frequently observed across highly injecting interfaces. An equivalent circuit for the examined dynamic system is provided, and an effective test for the industrial no-load switching contacts is proposed
Keywords :
bifurcation; chaos; contact potential; electrical contacts; equivalent circuits; negative resistance; stability; 50 Hz; I-V phase space; NDR formation; bifurcation; chaos; contact potential instabilities; equivalent circuit; high charge injection rates; industrial no-load switching contacts; mechanically contacted metals; metal-metal contacts; negative differential resistance; sinusoidal power source; test; Bifurcation; Chaos; Circuit testing; Connectors; Contacts; Metal-insulator structures; Power engineering and energy; Switches; Switching circuits; Temperature;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.296412
Filename :
296412
Link To Document :
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