• DocumentCode
    1118080
  • Title

    CAD-based net capacitance testing of unpopulated MCM substrates

  • Author

    Marshall, J. ; Chong, F.C. ; Modlin, D. ; Westbrook, S.

  • Author_Institution
    Acuson Computer Sonography, Mountain View, CA, USA
  • Volume
    17
  • Issue
    1
  • fYear
    1994
  • fDate
    2/1/1994 12:00:00 AM
  • Firstpage
    50
  • Lastpage
    55
  • Abstract
    This paper presents an approach to CAD-based generation of expected test values for capacitive net verification in unpopulated multiple-chip modules (MCMs). The superposition model underlying the capacitance estimation technique is discussed along with implementation details and test results from CAD-based testing of DEC VAX-9000 MCMs
  • Keywords
    automatic testing; capacitance; capacitance measurement; circuit CAD; integrated circuit testing; multichip modules; substrates; CAD-based generation; CAD-based testing; DEC VAX-9000 MCMs; capacitance estimation technique; capacitive net verification; multiple-chip modules; net capacitance testing; superposition model; unpopulated MCM substrates; Buildings; Capacitance measurement; Circuit testing; Costs; Databases; Design automation; Electronics packaging; Probes; System testing; Throughput;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.296430
  • Filename
    296430
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1118080