Title :
CAD-based net capacitance testing of unpopulated MCM substrates
Author :
Marshall, J. ; Chong, F.C. ; Modlin, D. ; Westbrook, S.
Author_Institution :
Acuson Computer Sonography, Mountain View, CA, USA
fDate :
2/1/1994 12:00:00 AM
Abstract :
This paper presents an approach to CAD-based generation of expected test values for capacitive net verification in unpopulated multiple-chip modules (MCMs). The superposition model underlying the capacitance estimation technique is discussed along with implementation details and test results from CAD-based testing of DEC VAX-9000 MCMs
Keywords :
automatic testing; capacitance; capacitance measurement; circuit CAD; integrated circuit testing; multichip modules; substrates; CAD-based generation; CAD-based testing; DEC VAX-9000 MCMs; capacitance estimation technique; capacitive net verification; multiple-chip modules; net capacitance testing; superposition model; unpopulated MCM substrates; Buildings; Capacitance measurement; Circuit testing; Costs; Databases; Design automation; Electronics packaging; Probes; System testing; Throughput;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
