DocumentCode :
1118105
Title :
Beam-Profiling and Wavefront-Sensing of THz Pulses at the Focus of a Substrate-Lens
Author :
Bitzer, Andreas ; Helm, Hanspeter ; Walther, Markus
Author_Institution :
Albert-Ludwigs Univ., Freiburg
Volume :
14
Issue :
2
fYear :
2008
Firstpage :
476
Lastpage :
481
Abstract :
We report combined wavefront detection and beam profiling of single-cycle terahertz (THz) pulses. In our system, the electric field is recorded highly resolved in two spatial and one temporal dimension before and after propagation through an optical component. Using this approach, we examine the imaging properties of a hyperhemispherical silicon lens as it is commonly used in THz dipole antennas. We observe an asymmetric spatiotemporal field dynamic in the focus, which can be attributed to distortion of the incident wavefront in combination with the image properties of the lens. Diffraction on the lens aperture influences the spectral beam profile at the focus. The frequency dependence of the Airy pattern indicates a rapidly degrading Strehl ratio with increasing frequency.
Keywords :
electromagnetic wave diffraction; infrared spectroscopy; lenses; submillimetre wave imaging; submillimetre wave propagation; submillimetre wave spectroscopy; wavefront sensors; Airy pattern; Strehl ratio; beam-profiling; far-infrared spectral region; hyperhemispherical silicon lens; lens aperture; optical component; spatiotemporal field dynamics; spectral beam profile; substrate-lens focus; terahertz dipole antennas; terahertz pulse diffraction; terahertz pulse propagation; terahertz pulses; terahertz time-domain spectroscopy; wavefront detection; wavefront distortion; wavefront-sensing; Antennas and propagation; Dipole antennas; Focusing; Lenses; Optical devices; Optical imaging; Optical propagation; Optical pulses; Silicon; Spatial resolution; Airy pattern; Strehl ratio; beam profiling; terahertz imaging; terahertz time-domain spectroscopy; wavefront sensing;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2007.910709
Filename :
4481102
Link To Document :
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