Title :
Superconducting tunnel junctions for use as energy resolving X-ray detectors
Author :
van Vechten, D. ; Boyer, C. ; Fritz, G.G. ; King, S. ; Kowaski, M.P. ; Lovellette, M.N. ; Blamire, M.G. ; Kirk, E. ; Somekh, R.E.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
The response of Nb-Al-Al2O3-Al-Nb superconductor-insulator-superconductor (SIS) tunnel junctions to pulsed 650-nm radiation was measured. The rise in the voltage developed across the junction increases linearly for the duration of the applied pulse. The decay time of 300 μs is an intrinsic property of the junction. The response of the junction varies linearly with incident energy over the range 35 to 200 eV/μm2. Comparison with the junction response caused by higher energy particles should give insight into the microscopic details of the extremely nonequilibrium pair breaking
Keywords :
X-ray detection and measurement; alumina; aluminium; niobium; superconducting junction devices; 300 mus; 650 nm; Nb-Al-Al2O3-Al-Nb; decay time; energy resolving X-ray detectors; nonequilibrium pair breaking; superconducting tunnel junctions; superconductor-insulator-superconductor; Capacitance; Current measurement; Energy resolution; Impedance; Josephson junctions; Niobium; Preamplifiers; Tin; Voltage; X-ray detectors;
Journal_Title :
Magnetics, IEEE Transactions on
